X-ray diffraction (XRD) patterns are a graphical representation of the intensity of X-rays diffracted by a crystalline material as a function of the diffraction angle. XRD patterns are used in materials science to identify and characterize crystalline materials based on their crystal structure and lattice parameters.
When X-rays are incident on a crystalline material, they interact with the atomic planes of the crystal lattice, causing them to scatter in different directions. This scattering, known as diffraction, occurs at specific angles determined by the spacing of the atomic planes and the wavelength of the incident X-rays, according to Bragg’s law:
[ n\lambda = 2d\sin(\theta) ]
where:
- ( n ) is an integer representing the order of the diffraction peak,
- ( \lambda ) is the wavelength of the X-rays,
- ( d ) is the spacing between atomic planes,
- ( \theta ) is the diffraction angle.
By measuring the intensity of the diffracted X-rays as a function of the diffraction angle, a characteristic pattern of peaks is obtained, which is unique to the crystal structure of the material. This pattern, known as the XRD pattern, can be used to identify the crystal structure of the material and determine its lattice parameters, grain size, and other structural properties.
XRD patterns are commonly used in materials science, geology, chemistry, and physics to study the crystal structure of a wide range of materials, including metals, ceramics, minerals, and polymers. They are an important tool for researchers and engineers working in the field of materials science and play a crucial role in the development of new materials and technologies.